Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu. Peng, W., Monlevade, E., & Marques, M. E Microelectronics Reliability, 47(12):2161–2168, December, 2007. bibtex @article{peng_effect_2007,
title = {Effect of thermal aging on the interfacial structure of {SnAgCu} solder joints on {Cu}},
volume = {47},
number = {12},
journal = {Microelectronics Reliability},
author = {Peng, Weiqun and Monlevade, Eduardo and Marques, Marco E},
month = dec,
year = {2007},
pages = {2161--2168},
}
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