Low energy scanning transmission electron beam induced current for nanoscale characterization of p-n junctions. Peretzki, P., Ifland, B., Jooss, C., & Seibt, M. physica status solidi (RRL) - Rapid Research Letters, 11:1600358, Wiley, 2016. ![Low energy scanning transmission electron beam induced current for nanoscale characterization of p-n junctions [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex 1 download @article{10.1002/pssr.201600358,
doi = {10.1002/pssr.201600358},
url = {http://dx.doi.org/10.1002/pssr.201600358},
year = 2016,
publisher = {Wiley},
volume = {11},
pages = {1600358},
author = {Patrick Peretzki and Benedikt Ifland and Christian Jooss and Michael Seibt},
title = {Low energy scanning transmission electron beam induced current for nanoscale characterization of p-n junctions},
journal = {physica status solidi ({RRL}) - Rapid Research Letters}
}
Downloads: 1
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