Structure of nanocrystalline GaN from x-ray diffraction, Rietveld and atomic pair distribution function analyses. Petkov, V., Gateshki, M., Choi, J., Gillan, E. G., & Ren, Y. J. Mater. Chem., 15:4654, 2005. bibtex: petko;jmc05 bibtex[nb=not-bg;grant=nirt03;wwwemail=sb2896@columbia.edu]doi bibtex @article{petkov_structure_2005-1,
title = {Structure of nanocrystalline {GaN} from x-ray diffraction, {Rietveld} and atomic pair distribution function analyses},
volume = {15},
doi = {10.1039/b509577h},
journal = {J. Mater. Chem.},
author = {Petkov, V. and Gateshki, M. and Choi, J. and Gillan, E. G. and Ren, Y.},
year = {2005},
note = {bibtex: petko;jmc05
bibtex[nb=not-bg;grant=nirt03;wwwemail=sb2896@columbia.edu]},
pages = {4654}
}
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