Characterization of Nanoporous Materials with Atom Probe Tomography. Pfeiffer, B., Erichsen, T., Epler, E., Volkert, C. A., Trompenaars, P., & Nowak, C. Microscopy and Microanalysis, 21:557–563, Cambridge University Press (CUP), 2015. ![Characterization of Nanoporous Materials with Atom Probe Tomography [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex 1 download @article{10.1017/s1431927615000501,
doi = {10.1017/s1431927615000501},
url = {http://dx.doi.org/10.1017/s1431927615000501},
year = 2015,
publisher = {Cambridge University Press ({CUP})},
volume = {21},
pages = {557--563},
author = {Björn Pfeiffer and Torben Erichsen and Eike Epler and Cynthia A. Volkert and Piet Trompenaars and Carsten Nowak},
title = {Characterization of Nanoporous Materials with Atom Probe Tomography},
journal = {Microscopy and Microanalysis}
}
Downloads: 1
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