@inproceedings{phinikaridesComparisonAnalysisMethods2013,
  title = {Comparison of Analysis Methods for the Calculation of Degradation Rates of Different Photovoltaic Technologies},
  booktitle = {28th {{EU-PVSEC}}},
  author = {Phinikarides, Alexander and Makrides, George and Georghiou, George E},
  year = {2013},
  pages = {3973--3976},
  address = {{Paris, France}},
  doi = {10.4229/28thEUPVSEC2013-5BV.4.39},
  abstract = {The degradation rates of crystalline silicon (c-Si) and thin-film photovoltaic (PV) systems of different manufacturers and different technologies were calculated and compared for the systems' first five years of outdoors exposure, by applying a host of different analysis methods, in order to quantify the differences between each method. These include linear regression using linear least squares (LLS), classical seasonal decomposition (CSD) and seasonal-trend decomposition by Loess (STL) on daily and monthly time series of two performance metrics, performance ratio (PR) and PR with temperature correction (PR-TC). The comparison of the resulting degradation rates for each PV group (c-Si and thin-film) showed that the monthly PR-TC-STL method provided the lowest standard deviation and a mean degradation rate of 1.12 \{\%\}/year for the c-Si PV systems. On the other hand, the daily PR-TC-LLS method demonstrated the lowest standard deviation and an average degradation rate of 2.47 \{\%\}/year for the thin-film PV systems. Linear regression using LLS produced the lowest degradation rates overall, but when temperature correction was applied, the calculated degradation rates were increased by 0.4 \{\%\}/year. LLS also showed the lowest standard deviation for the thin-film PV systems, which was further reduced by applying temperature correction.},
  copyright = {All rights reserved},
  keywords = {crystalline,degradation,Grid-connected,thin film},
  file = {/home/alexis/Zotero/storage/6RNW2XKX/Phinikarides et al. - 2013 - Comparison of analysis methods for the calculation.pdf}
}

{"_id":"ixjNvd58weaxzvkQr","bibbaseid":"phinikarides-makrides-georghiou-comparisonofanalysismethodsforthecalculationofdegradationratesofdifferentphotovoltaictechnologies-2013","author_short":["Phinikarides, A.","Makrides, G.","Georghiou, G. E"],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","title":"Comparison of Analysis Methods for the Calculation of Degradation Rates of Different Photovoltaic Technologies","booktitle":"28th EU-PVSEC","author":[{"propositions":[],"lastnames":["Phinikarides"],"firstnames":["Alexander"],"suffixes":[]},{"propositions":[],"lastnames":["Makrides"],"firstnames":["George"],"suffixes":[]},{"propositions":[],"lastnames":["Georghiou"],"firstnames":["George","E"],"suffixes":[]}],"year":"2013","pages":"3973–3976","address":"Paris, France","doi":"10.4229/28thEUPVSEC2013-5BV.4.39","abstract":"The degradation rates of crystalline silicon (c-Si) and thin-film photovoltaic (PV) systems of different manufacturers and different technologies were calculated and compared for the systems' first five years of outdoors exposure, by applying a host of different analysis methods, in order to quantify the differences between each method. These include linear regression using linear least squares (LLS), classical seasonal decomposition (CSD) and seasonal-trend decomposition by Loess (STL) on daily and monthly time series of two performance metrics, performance ratio (PR) and PR with temperature correction (PR-TC). The comparison of the resulting degradation rates for each PV group (c-Si and thin-film) showed that the monthly PR-TC-STL method provided the lowest standard deviation and a mean degradation rate of 1.12 \\%\\/year for the c-Si PV systems. On the other hand, the daily PR-TC-LLS method demonstrated the lowest standard deviation and an average degradation rate of 2.47 \\%\\/year for the thin-film PV systems. Linear regression using LLS produced the lowest degradation rates overall, but when temperature correction was applied, the calculated degradation rates were increased by 0.4 \\%\\/year. LLS also showed the lowest standard deviation for the thin-film PV systems, which was further reduced by applying temperature correction.","copyright":"All rights reserved","keywords":"crystalline,degradation,Grid-connected,thin film","file":"/home/alexis/Zotero/storage/6RNW2XKX/Phinikarides et al. - 2013 - Comparison of analysis methods for the calculation.pdf","bibtex":"@inproceedings{phinikaridesComparisonAnalysisMethods2013,\n title = {Comparison of Analysis Methods for the Calculation of Degradation Rates of Different Photovoltaic Technologies},\n booktitle = {28th {{EU-PVSEC}}},\n author = {Phinikarides, Alexander and Makrides, George and Georghiou, George E},\n year = {2013},\n pages = {3973--3976},\n address = {{Paris, France}},\n doi = {10.4229/28thEUPVSEC2013-5BV.4.39},\n abstract = {The degradation rates of crystalline silicon (c-Si) and thin-film photovoltaic (PV) systems of different manufacturers and different technologies were calculated and compared for the systems' first five years of outdoors exposure, by applying a host of different analysis methods, in order to quantify the differences between each method. These include linear regression using linear least squares (LLS), classical seasonal decomposition (CSD) and seasonal-trend decomposition by Loess (STL) on daily and monthly time series of two performance metrics, performance ratio (PR) and PR with temperature correction (PR-TC). The comparison of the resulting degradation rates for each PV group (c-Si and thin-film) showed that the monthly PR-TC-STL method provided the lowest standard deviation and a mean degradation rate of 1.12 \\{\\%\\}/year for the c-Si PV systems. On the other hand, the daily PR-TC-LLS method demonstrated the lowest standard deviation and an average degradation rate of 2.47 \\{\\%\\}/year for the thin-film PV systems. Linear regression using LLS produced the lowest degradation rates overall, but when temperature correction was applied, the calculated degradation rates were increased by 0.4 \\{\\%\\}/year. LLS also showed the lowest standard deviation for the thin-film PV systems, which was further reduced by applying temperature correction.},\n copyright = {All rights reserved},\n keywords = {crystalline,degradation,Grid-connected,thin film},\n file = {/home/alexis/Zotero/storage/6RNW2XKX/Phinikarides et al. - 2013 - Comparison of analysis methods for the calculation.pdf}\n}\n\n","author_short":["Phinikarides, A.","Makrides, G.","Georghiou, G. E"],"key":"phinikaridesComparisonAnalysisMethods2013","id":"phinikaridesComparisonAnalysisMethods2013","bibbaseid":"phinikarides-makrides-georghiou-comparisonofanalysismethodsforthecalculationofdegradationratesofdifferentphotovoltaictechnologies-2013","role":"author","urls":{},"keyword":["crystalline","degradation","Grid-connected","thin film"],"metadata":{"authorlinks":{}},"html":""},"bibtype":"inproceedings","biburl":"https://alexisph.github.io/alexander.bib","dataSources":["EdXGkEcjMZQF5CuiR","wkdr2EqAZ8v976o9g"],"keywords":["crystalline","degradation","grid-connected","thin film"],"search_terms":["comparison","analysis","methods","calculation","degradation","rates","different","photovoltaic","technologies","phinikarides","makrides","georghiou"],"title":"Comparison of Analysis Methods for the Calculation of Degradation Rates of Different Photovoltaic Technologies","year":2013}