Statistics of single-electron signals in electron-multiplying charge-coupled devices. Plakhotnik, T., Chennu, A., & Zvyagin, A. IEEE Transactions On Electron Devices, 53(4):618–622, Institute of Electrical & Electronics Engineers (IEEE), Apr, 2006.
Statistics of single-electron signals in electron-multiplying charge-coupled devices [link]Paper  doi  bibtex   
@Article{Plakhotnik-2006-Statistics,
  Title                    = {Statistics of single-electron signals in electron-multiplying charge-coupled devices},
  Author                   = {Plakhotnik, T. and Chennu, A. and Zvyagin, A.V.},
  Journal                  = {IEEE Transactions On Electron Devices},
  Year                     = {2006},

  Month                    = {Apr},
  Number                   = {4},
  Pages                    = {618–622},
  Volume                   = {53},

  Doi                      = {10.1109/ted.2006.870572},
  ISSN                     = {0018-9383},
  Owner                    = {arjun},
  Publisher                = {Institute of Electrical \& Electronics Engineers (IEEE)},
  Timestamp                = {2015.10.13},
  Url                      = {http://dx.doi.org/10.1109/TED.2006.870572}
}

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