Estimating spatial and temporal patterns of defects. Plumlee, M. & Shi, J. Manufacturing Letters, 1(1):25–27, Elsevier, 2013.
bibtex   
@article{plumlee2013estimating,
  title={Estimating spatial and temporal patterns of defects},
  author={Plumlee, Matthew and Shi, Jianjun},
  journal={Manufacturing Letters},
  volume={1},
  number={1},
  pages={25--27},
  year={2013},
  publisher={Elsevier}
}

Downloads: 0