Estimating spatial and temporal patterns of defects. Plumlee, M. & Shi, J. Manufacturing Letters, 1(1):25–27, Elsevier, 2013. bibtex @article{plumlee2013estimating,
title={Estimating spatial and temporal patterns of defects},
author={Plumlee, Matthew and Shi, Jianjun},
journal={Manufacturing Letters},
volume={1},
number={1},
pages={25--27},
year={2013},
publisher={Elsevier}
}
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