Improving biometric device interoperability by likelihood ratio-based quality dependent score normalization. Poh, N., Kittler, J., & Bourlai, T. In Proc. IEEE International Conference on Biometrics: Theory, Applications, and Systems, pages 1--5, Washington DC, September 27-29, 2007. IEEE.
bibtex   
@Inproceedings{Poh_2007_12785,
  author = {Poh, N. and Kittler, J. and Bourlai, T.},
 address = {Washington DC},
 booktitle = {Proc. IEEE International Conference on Biometrics: Theory, Applications, and Systems},
 month = {September 27-29},
 organization = {IEEE},
 pages = {1--5},
 title = {Improving biometric device interoperability by likelihood ratio-based quality dependent score normalization},
 year = {2007},
 title_with_no_special_chars = {Improving biometric device interoperability by likelihood ratiobased quality dependent score normalization}
}

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