Counteracting malicious faults in cryptographic circuits. Polian, I. & Regazzoni, F. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017, pages 1–10, 2017. IEEE. Paper doi bibtex @inproceedings{DBLP:conf/ets/PolianR17,
author = {Ilia Polian and
Francesco Regazzoni},
title = {Counteracting malicious faults in cryptographic circuits},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968230},
doi = {10.1109/ETS.2017.7968230},
timestamp = {Tue, 31 Mar 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/PolianR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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