Counteracting malicious faults in cryptographic circuits. Polian, I. & Regazzoni, F. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017, pages 1–10, 2017. IEEE.
Counteracting malicious faults in cryptographic circuits [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/ets/PolianR17,
  author    = {Ilia Polian and
               Francesco Regazzoni},
  title     = {Counteracting malicious faults in cryptographic circuits},
  booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
               May 22-26, 2017},
  pages     = {1--10},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/ETS.2017.7968230},
  doi       = {10.1109/ETS.2017.7968230},
  timestamp = {Tue, 31 Mar 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/PolianR17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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