Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits

Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits. Pradubsuwun, D., Yoneda, T., & Myers, C. J. In Automated Technology for Verification and Analysis: Second International Conference, ATVA 2004, Taipei, Taiwan, ROC, October 31-November 3, 2004. Proceedings, pages 339–353, 2004.

Paper doi bibtex

@inproceedings{DBLP:conf/atva/PradubsuwunYM04,
  author    = {Denduang Pradubsuwun and
               Tomohiro Yoneda and
               Chris J. Myers},
  title     = {Partial Order Reduction for Detecting Safety and Timing Failures of
               Timed Circuits},
  booktitle = {Automated Technology for Verification and Analysis: Second International
               Conference, {ATVA} 2004, Taipei, Taiwan, ROC, October 31-November
               3, 2004. Proceedings},
  pages     = {339--353},
  year      = {2004},
  crossref  = {DBLP:conf/atva/2004},
  url       = {https://doi.org/10.1007/978-3-540-30476-0\_28},
  doi       = {10.1007/978-3-540-30476-0\_28},
  timestamp = {Tue, 14 May 2019 10:00:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/atva/PradubsuwunYM04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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