Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits. Pradubsuwun, D., Yoneda, T., & Myers, C. J. In Automated Technology for Verification and Analysis: Second International Conference, ATVA 2004, Taipei, Taiwan, ROC, October 31-November 3, 2004. Proceedings, pages 339–353, 2004. Paper doi bibtex @inproceedings{DBLP:conf/atva/PradubsuwunYM04,
author = {Denduang Pradubsuwun and
Tomohiro Yoneda and
Chris J. Myers},
title = {Partial Order Reduction for Detecting Safety and Timing Failures of
Timed Circuits},
booktitle = {Automated Technology for Verification and Analysis: Second International
Conference, {ATVA} 2004, Taipei, Taiwan, ROC, October 31-November
3, 2004. Proceedings},
pages = {339--353},
year = {2004},
crossref = {DBLP:conf/atva/2004},
url = {https://doi.org/10.1007/978-3-540-30476-0\_28},
doi = {10.1007/978-3-540-30476-0\_28},
timestamp = {Tue, 14 May 2019 10:00:49 +0200},
biburl = {https://dblp.org/rec/bib/conf/atva/PradubsuwunYM04},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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