Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits

Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits. Pradubsuwun, D., Yoneda, T., & Myers, C. J. IEICE Transactions, 88-D(7):1646–1661, 2005.

Paper doi bibtex

@article{DBLP:journals/ieicet/PradubsuwunYM05,
  author    = {Denduang Pradubsuwun and
               Tomohiro Yoneda and
               Chris J. Myers},
  title     = {Partial Order Reduction for Detecting Safety and Timing Failures of
               Timed Circuits},
  journal   = {{IEICE} Transactions},
  volume    = {88-D},
  number    = {7},
  pages     = {1646--1661},
  year      = {2005},
  url       = {https://doi.org/10.1093/ietisy/e88-d.7.1646},
  doi       = {10.1093/ietisy/e88-d.7.1646},
  timestamp = {Sun, 02 Jun 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/ieicet/PradubsuwunYM05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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