Conductivity measurement of individual SnS nanoparticles by Peak Force AFM. Prastani, C., Vetushka, A., Hývl, M., Fejfar, A., Nanu, M., Nanu, D., Schropp, R.&nbsp;E.<nbsp>I., & Rath, J.&nbsp;K. In MRS Online Proceedings Library, volume 1557, pages null--null, San Francisco, USA, 2013. Materials Research Society. 00000
Conductivity measurement of individual SnS nanoparticles by Peak Force AFM [link]Paper  doi  abstract   bibtex   
In this work SnS nanoparticles capped with tri-n-octylphosphine oxide (TOPO) have been characterized by Peak Force AFM. The topography map clearly showed single nanoparticles with a size less than 5 nm and spherical shape. In the conductivity map it was possible to discern the same nanoparticles. The same nanoparticles have been measured also by Torsional Resonant TUNA AFM in order to compare it with Peak Force AFM. From this comparison it has been found that the conductivity of nanoparticles, even if they are capped with TOPO, can be measured by Peak Force AFM, a result that thus far has been difficult to achieve by other types of AFM.
@inproceedings{ prastani_conductivity_2013,
  address = {San Francisco, {USA}},
  title = {Conductivity measurement of individual {SnS} nanoparticles by Peak Force {AFM}},
  volume = {1557},
  url = {http://journals.cambridge.org/article_S1946427413011081},
  doi = {10.1557/opl.2013.1108},
  abstract = {In this work {SnS} nanoparticles capped with tri-n-octylphosphine oxide ({TOPO}) have been characterized by Peak Force {AFM}. The topography map clearly showed single nanoparticles with a size less than 5 nm and spherical shape. In the conductivity map it was possible to discern the same nanoparticles.
The same nanoparticles have been measured also by Torsional Resonant {TUNA} {AFM} in order to compare it with Peak Force {AFM}. From this comparison it has been found that the conductivity of nanoparticles, even if they are capped with {TOPO}, can be measured by Peak Force {AFM}, a result that thus far has been difficult to achieve by other types of {AFM}.},
  booktitle = {{MRS} Online Proceedings Library},
  publisher = {Materials Research Society},
  author = {Prastani, C. and Vetushka, A. and Hývl, M. and Fejfar, A. and Nanu, M. and Nanu, D. and Schropp, R. E. I. and Rath, J. K.},
  year = {2013},
  note = {00000},
  keywords = {Electrical properties, Scanning probe microscopy ({SPM}), nanostructure},
  pages = {null--null}
}

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