Metrology Methodologies from High Precision Applications. Pryor, M., Kang, S., & Tesar, D. In Proceedings of the 2005 ANS Annual Meeting, San Diego, CA, June, 2005. ANS.
bibtex   
@inproceedings{pryor_metrology_2005,
	address = {San Diego, CA},
	title = {Metrology {Methodologies} from {High} {Precision} {Applications}},
	booktitle = {Proceedings of the 2005 {ANS} {Annual} {Meeting}},
	publisher = {ANS},
	author = {Pryor, Mitch and Kang, Seong-Ho and Tesar, Delbert},
	month = jun,
	year = {2005},
}

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