Comparison of Delay Tests on Silicon. Qiu, W., Walker, D. M.<nbsp>H., Simpson, N., Reddy, D., & Moore, A. In Davidson, S. & Gattiker, A., editors, ITC, pages 1-10, 2006. IEEE.
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Paper bibtex @inproceedings{ conf/itc/QiuWSRM06,
added-at = {2012-02-07T00:00:00.000+0100},
author = {Qiu, Wangqi and Walker, D. M. H. and Simpson, Neil and Reddy, Divya and Moore, Anthony},
biburl = {http://www.bibsonomy.org/bibtex/26abba5d32633a634ed89ba39e88edbdd/dblp},
booktitle = {ITC},
crossref = {conf/itc/2006},
editor = {Davidson, Scott and Gattiker, Anne},
ee = {http://dx.doi.org/10.1109/TEST.2006.297624},
interhash = {97baa5c19dc65aa96e4ebff5fbc0e10d},
intrahash = {6abba5d32633a634ed89ba39e88edbdd},
isbn = {1-4244-0292-1},
keywords = {dblp},
pages = {1-10},
publisher = {IEEE},
title = {Comparison of Delay Tests on Silicon.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2006.html#QiuWSRM06},
year = {2006}
}
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