@inproceedings{ conf/itc/QiuWSRM06,
  added-at = {2012-02-07T00:00:00.000+0100},
  author = {Qiu, Wangqi and Walker, D. M. H. and Simpson, Neil and Reddy, Divya and Moore, Anthony},
  biburl = {http://www.bibsonomy.org/bibtex/26abba5d32633a634ed89ba39e88edbdd/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2006},
  editor = {Davidson, Scott and Gattiker, Anne},
  ee = {http://dx.doi.org/10.1109/TEST.2006.297624},
  interhash = {97baa5c19dc65aa96e4ebff5fbc0e10d},
  intrahash = {6abba5d32633a634ed89ba39e88edbdd},
  isbn = {1-4244-0292-1},
  keywords = {dblp},
  pages = {1-10},
  publisher = {IEEE},
  title = {Comparison of Delay Tests on Silicon.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2006.html#QiuWSRM06},
  year = {2006}
}

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