@inproceedings{ conf/dac/RajsumanJM89,
  added-at = {2002-12-16T00:00:00.000+0100},
  author = {Rajsuman, Rochit and Jayasumana, Anura P. and Malaiya, Yashwant K.},
  biburl = {http://www.bibsonomy.org/bibtex/26656801d725a6f2d42893cc29dcf9fc8/dblp},
  booktitle = {DAC},
  date = {2002-12-16},
  description = {dblp},
  ee = {http://doi.acm.org/10.1145/74382.74511},
  interhash = {330cd14d880a29f0dc0222594e118cdf},
  intrahash = {6656801d725a6f2d42893cc29dcf9fc8},
  keywords = {dblp},
  pages = {714-717},
  title = {CMOS Stuck-open Fault Detection Using Single Test Patterns.},
  url = {http://dblp.uni-trier.de/db/conf/dac/dac89.html#RajsumanJM89},
  year = {1989}
}

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