An Evaluation of March-based Testing Algorithms Using Switch Level Model of Bit-oriented SRAM. Rawat,  I. & Sahula,  V. In 8th IEEE VLSI Design and Test Workshops, 2004.  
Paper  bibtex   @inproceedings{
 title = {An Evaluation of March-based Testing Algorithms Using Switch Level Model of Bit-oriented SRAM},
 type = {inproceedings},
 year = {2004},
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 created = {2014-04-17T21:17:22.000Z},
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 authored = {true},
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 citation_key = {sahula2004evaluation},
 source_type = {inproceedings},
 private_publication = {false},
 bibtype = {inproceedings},
 author = {Rawat, Indira and Sahula, V},
 booktitle = {8th IEEE VLSI Design and Test Workshops}
} 
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