@inproceedings{
 title = {An Evaluation of March-based Testing Algorithms Using Switch Level Model of Bit-oriented SRAM},
 type = {inproceedings},
 year = {2004},
 id = {4ceccd49-4da6-3014-98de-57859504f2f6},
 created = {2014-04-17T21:17:22.000Z},
 file_attached = {true},
 profile_id = {03d2ca17-6bde-3cfe-95de-fcbe4f21507b},
 last_modified = {2017-03-14T01:22:09.162Z},
 read = {false},
 starred = {false},
 authored = {true},
 confirmed = {true},
 hidden = {false},
 citation_key = {sahula2004evaluation},
 source_type = {inproceedings},
 private_publication = {false},
 bibtype = {inproceedings},
 author = {Rawat, Indira and Sahula, V},
 booktitle = {8th IEEE VLSI Design and Test Workshops}
}

{"_id":"D5edAhaiWAoboE2BD","bibbaseid":"rawat-sahula-anevaluationofmarchbasedtestingalgorithmsusingswitchlevelmodelofbitorientedsram-2004","author_short":["Rawat, I.","Sahula, V."],"bibdata":{"title":"An Evaluation of March-based Testing Algorithms Using Switch Level Model of Bit-oriented SRAM","type":"inproceedings","year":"2004","id":"4ceccd49-4da6-3014-98de-57859504f2f6","created":"2014-04-17T21:17:22.000Z","file_attached":"true","profile_id":"03d2ca17-6bde-3cfe-95de-fcbe4f21507b","last_modified":"2017-03-14T01:22:09.162Z","read":false,"starred":false,"authored":"true","confirmed":"true","hidden":false,"citation_key":"sahula2004evaluation","source_type":"inproceedings","private_publication":false,"bibtype":"inproceedings","author":"Rawat, Indira and Sahula, V","booktitle":"8th IEEE VLSI Design and Test Workshops","bibtex":"@inproceedings{\n title = {An Evaluation of March-based Testing Algorithms Using Switch Level Model of Bit-oriented SRAM},\n type = {inproceedings},\n year = {2004},\n id = {4ceccd49-4da6-3014-98de-57859504f2f6},\n created = {2014-04-17T21:17:22.000Z},\n file_attached = {true},\n profile_id = {03d2ca17-6bde-3cfe-95de-fcbe4f21507b},\n last_modified = {2017-03-14T01:22:09.162Z},\n read = {false},\n starred = {false},\n authored = {true},\n confirmed = {true},\n hidden = {false},\n citation_key = {sahula2004evaluation},\n source_type = {inproceedings},\n private_publication = {false},\n bibtype = {inproceedings},\n author = {Rawat, Indira and Sahula, V},\n booktitle = {8th IEEE VLSI Design and Test Workshops}\n}","author_short":["Rawat, I.","Sahula, V."],"biburl":"https://bibbase.org/service/mendeley/03d2ca17-6bde-3cfe-95de-fcbe4f21507b","bibbaseid":"rawat-sahula-anevaluationofmarchbasedtestingalgorithmsusingswitchlevelmodelofbitorientedsram-2004","role":"author","urls":{},"metadata":{"authorlinks":{}}},"bibtype":"inproceedings","biburl":"https://bibbase.org/service/mendeley/03d2ca17-6bde-3cfe-95de-fcbe4f21507b","dataSources":["YNoDN2TgaRvNK6vy3","ya2CyA73rpZseyrZ8","2252seNhipfTmjEBQ"],"keywords":[],"search_terms":["evaluation","march","based","testing","algorithms","using","switch","level","model","bit","oriented","sram","rawat","sahula"],"title":"An Evaluation of March-based Testing Algorithms Using Switch Level Model of Bit-oriented SRAM","year":2004}