@inproceedings{ dblp2496130,
  title = {A Memory Fault Simulator for Radiation-Induced Effects in SRAMs},
  author = {Paolo Rech and Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Luigi Dilillo},
  author_short = {Rech, P. and Bosio, A. and Girard, P. and Pravossoudovitch, S. and Virazel, A. and Dilillo, L.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2010},
  key = {dblp2496130},
  id = {dblp2496130},
  biburl = {http://www.dblp.org/rec/bibtex/conf/ats/RechBGPVD10},
  url = {http://dx.doi.org/10.1109/ATS.2010.26},
  conference = {Asian Test Symposium},
  pages = {100-105},
  text = {Asian Test Symposium 2010:100-105},
  booktitle = {Proceedings of Asian Test Symposium}
}

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