Electron-Probe Measurements near Phase Boundaries. Reed, S. & Long, J. In X-ray Optics and X-ray Microanalysis, pages 317–327. Elsevier, 1963. 00002
Paper doi bibtex @incollection{reed_electron-probe_1963,
title = {Electron-{Probe} {Measurements} near {Phase} {Boundaries}},
isbn = {978-1-4832-3322-2},
url = {https://linkinghub.elsevier.com/retrieve/pii/B9781483233222500354},
language = {en},
urldate = {2020-09-23},
booktitle = {X-ray {Optics} and {X}-ray {Microanalysis}},
publisher = {Elsevier},
author = {Reed, S.J.B. and Long, J.V.P.},
year = {1963},
doi = {10.1016/B978-1-4832-3322-2.50035-4; http://web.archive.org/web/20200923134026/https://linkinghub.elsevier.com/retrieve/pii/B9781483233222500354},
note = {00002 },
keywords = {archived},
pages = {317--327},
}
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