Power Attacks Resistance of Cryptographic S-Boxes with Added Error Detection Circuits. Regazzoni, F., Eisenbarth, T., Großschädl, J., Breveglieri, L., Ienne, P., Koren, I., & Paar, C. In Bolchini, C., Kim, Y., Salsano, A., & Touba, N. A., editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy, pages 508–516, 2007. IEEE Computer Society. Paper doi bibtex @inproceedings{DBLP:conf/dft/RegazzoniEGBIKP07,
author = {Francesco Regazzoni and
Thomas Eisenbarth and
Johann Gro{\ss}sch{\"{a}}dl and
Luca Breveglieri and
Paolo Ienne and
Israel Koren and
Christof Paar},
editor = {Cristiana Bolchini and
Yong{-}Bin Kim and
Adelio Salsano and
Nur A. Touba},
title = {Power Attacks Resistance of Cryptographic S-Boxes with Added Error
Detection Circuits},
booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
pages = {508--516},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DFT.2007.61},
doi = {10.1109/DFT.2007.61},
timestamp = {Tue, 31 Mar 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/RegazzoniEGBIKP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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