Power Attacks Resistance of Cryptographic S-Boxes with Added Error Detection Circuits. Regazzoni, F., Eisenbarth, T., Großschädl, J., Breveglieri, L., Ienne, P., Koren, I., & Paar, C. In Bolchini, C., Kim, Y., Salsano, A., & Touba, N. A., editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy, pages 508–516, 2007. IEEE Computer Society.
Power Attacks Resistance of Cryptographic S-Boxes with Added Error Detection Circuits [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/dft/RegazzoniEGBIKP07,
  author    = {Francesco Regazzoni and
               Thomas Eisenbarth and
               Johann Gro{\ss}sch{\"{a}}dl and
               Luca Breveglieri and
               Paolo Ienne and
               Israel Koren and
               Christof Paar},
  editor    = {Cristiana Bolchini and
               Yong{-}Bin Kim and
               Adelio Salsano and
               Nur A. Touba},
  title     = {Power Attacks Resistance of Cryptographic S-Boxes with Added Error
               Detection Circuits},
  booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
  pages     = {508--516},
  publisher = {{IEEE} Computer Society},
  year      = {2007},
  url       = {https://doi.org/10.1109/DFT.2007.61},
  doi       = {10.1109/DFT.2007.61},
  timestamp = {Tue, 31 Mar 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/dft/RegazzoniEGBIKP07.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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