Device-Level Transient Fault Modeling. Ries, G. L., Choi, G. S., & Iyer, R. K. In Digest of Papers: FTCS/24, The Twenty-Fourth Annual International Symposium on Fault-Tolerant Computing, Austin, Texas, USA, June 15-17, 1994, pages 86–94, 1994. Paper doi bibtex @inproceedings{DBLP:conf/ftcs/RiesCI94,
author = {Gregory L. Ries and
Gwan S. Choi and
Ravishankar K. Iyer},
title = {Device-Level Transient Fault Modeling},
booktitle = {Digest of Papers: FTCS/24, The Twenty-Fourth Annual International
Symposium on Fault-Tolerant Computing, Austin, Texas, USA, June 15-17,
1994},
pages = {86--94},
year = {1994},
crossref = {DBLP:conf/ftcs/1994},
url = {https://doi.org/10.1109/FTCS.1994.315654},
doi = {10.1109/FTCS.1994.315654},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/bib/conf/ftcs/RiesCI94},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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