Device-Level Transient Fault Modeling. Ries, G. L., Choi, G. S., & Iyer, R. K. In Digest of Papers: FTCS/24, The Twenty-Fourth Annual International Symposium on Fault-Tolerant Computing, Austin, Texas, USA, June 15-17, 1994, pages 86–94, 1994.
Device-Level Transient Fault Modeling [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/ftcs/RiesCI94,
  author    = {Gregory L. Ries and
               Gwan S. Choi and
               Ravishankar K. Iyer},
  title     = {Device-Level Transient Fault Modeling},
  booktitle = {Digest of Papers: FTCS/24, The Twenty-Fourth Annual International
               Symposium on Fault-Tolerant Computing, Austin, Texas, USA, June 15-17,
               1994},
  pages     = {86--94},
  year      = {1994},
  crossref  = {DBLP:conf/ftcs/1994},
  url       = {https://doi.org/10.1109/FTCS.1994.315654},
  doi       = {10.1109/FTCS.1994.315654},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ftcs/RiesCI94},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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