On the Evaluation of Failure Probabilities for Nanoelectronic Applications. Römer, U. & Schöps, S. March 2016.
bibtex   
@Poster{          Romer_2016ac,
  author        = {Römer, Ulrich and Schöps, Sebastian},
  booktitle     = {87th Annual Meeting of the International Association of Applied Mathematics and Mechanics ({GAMM} 2016)},
  citable       = {0},
  day           = {7},
  file          = {Romer_2016ac.pdf},
  group         = {simurom,nanocops,gsce,schoeps,roemer},
  internal      = {0},
  keywords      = {uncertainty,gpc,adjoint,field-circuit,rare-events},
  langid        = {english},
  month         = mar,
  title         = {On the Evaluation of Failure Probabilities for Nanoelectronic Applications},
  year          = {2016}
}

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