New tools and methodology for advanced parametric and defect structure test. Robertazzi, R., Medina, L., Shiling, E., Moore, G., Geiger, R., Liao, J., & Williamson, J. In Press, R. & Volkerink, E. H., editors, ITC, pages 19-28, 2010. IEEE.
New tools and methodology for advanced parametric and defect structure test. [link]Link  New tools and methodology for advanced parametric and defect structure test. [link]Paper  bibtex   
@inproceedings{ conf/itc/RobertazziMSMGLW10,
  added-at = {2012-02-06T00:00:00.000+0100},
  author = {Robertazzi, Raphael and Medina, Louis and Shiling, Ernesto and Moore, Garry and Geiger, Ronald and Liao, Jiun-Hsin and Williamson, John},
  biburl = {http://www.bibsonomy.org/bibtex/25d7ece2bc1d20a32093b22178ae1d016/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2010},
  editor = {Press, Ron and Volkerink, Erik H.},
  ee = {http://dx.doi.org/10.1109/TEST.2010.5699201},
  interhash = {36e0b701c382c3d43901c3799e1380a5},
  intrahash = {5d7ece2bc1d20a32093b22178ae1d016},
  isbn = {978-1-4244-7206-2},
  keywords = {dblp},
  pages = {19-28},
  publisher = {IEEE},
  title = {New tools and methodology for advanced parametric and defect structure test.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2010.html#RobertazziMSMGLW10},
  year = {2010}
}

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