Novel nanoscale thermal property imaging technique: The 2ω method. II. Demonstration and comparison. Roh, H. H., Lee, J. S., Kim, D. L., Park, J., Kim, K., Kwon, O., Park, S. H., Choi, Y. K., & Majumdar, A. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 24:2405, 2006, 2006.
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Paper bibtex
Paper bibtex @article {677,
title = {Novel nanoscale thermal property imaging technique: The 2ω method. II. Demonstration and comparison},
journal = {Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures},
volume = {24},
year = {2006},
month = {2006},
pages = {2405},
isbn = {10711023},
url = {http://scitation.aip.org/content/avs/journal/jvstb/24/5/10.1116/1.2353843},
author = {Roh, Hee Hwan and Lee, Joon Sik and Kim, Dong Lib and Park, Jisang and Kim, Kyeongtae and Kwon, Ohmyoung and Park, Seung Ho and Choi, Young Ki and Majumdar, Arun}
}Downloads: 0
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