Novel nanoscale thermal property imaging technique: The 2ω method. II. Demonstration and comparison. Roh, H. H.; Lee, J. S.; Kim, D. L.; Park, J.; Kim, K.; Kwon, O.; Park, S. H.; Choi, Y. K.; and Majumdar, A. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 24:2405, 2006, 2006.
Novel nanoscale thermal property imaging technique: The 2ω method. II. Demonstration and comparison [link]Paper  bibtex   
@article {677,
	title = {Novel nanoscale thermal property imaging technique: The 2ω method. II. Demonstration and comparison},
	journal = {Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures},
	volume = {24},
	year = {2006},
	month = {2006},
	pages = {2405},
	isbn = {10711023},
	url = {http://scitation.aip.org/content/avs/journal/jvstb/24/5/10.1116/1.2353843},
	author = {Roh, Hee Hwan and Lee, Joon Sik and Kim, Dong Lib and Park, Jisang and Kim, Kyeongtae and Kwon, Ohmyoung and Park, Seung Ho and Choi, Young Ki and Majumdar, Arun}
}
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