Synthetic aperture radar interferometry. Rosen, P., Hensley, S., Joughin, I., Li, F., Madsen, S., Rodriguez, E., & Goldstein, R. Proceedings of the IEEE, 88(3):333–382, March, 2000. Conference Name: Proceedings of the IEEE
Paper doi abstract bibtex Synthetic aperture radar interferometry is an imaging technique for measuring the topography of a surface, its changes over time, and other changes in the detailed characteristic of the surface. By exploiting the phase of the coherent radar signal, interferometry has transformed radar remote sensing from a largely interpretive science to a quantitative tool, with applications in cartography, geodesy, land cover characterization, and natural hazards. This paper reviews the techniques of interferometry, systems and limitations, and applications in a rapidly growing area of science and engineering.
@article{rosen_synthetic_2000,
title = {Synthetic aperture radar interferometry},
volume = {88},
issn = {1558-2256},
url = {https://ieeexplore.ieee.org/abstract/document/838084?casa_token=MGiFlAC0tHcAAAAA:r5A_s3n7h4emMpcukmZKDX4_7BHN8Tbt58r-S6y7qD_Rg_jUiOYxc_r0L6WMWnDdC8gldc_mriqM},
doi = {10.1109/5.838084},
abstract = {Synthetic aperture radar interferometry is an imaging technique for measuring the topography of a surface, its changes over time, and other changes in the detailed characteristic of the surface. By exploiting the phase of the coherent radar signal, interferometry has transformed radar remote sensing from a largely interpretive science to a quantitative tool, with applications in cartography, geodesy, land cover characterization, and natural hazards. This paper reviews the techniques of interferometry, systems and limitations, and applications in a rapidly growing area of science and engineering.},
number = {3},
urldate = {2023-11-27},
journal = {Proceedings of the IEEE},
author = {Rosen, P.A. and Hensley, S. and Joughin, I.R. and Li, F.K. and Madsen, S.N. and Rodriguez, E. and Goldstein, R.M.},
month = mar,
year = {2000},
note = {Conference Name: Proceedings of the IEEE},
pages = {333--382},
}
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