@book{rosenauer_transmission_2003,
	address = {Berlin ; New York},
	series = {Springer tracts in modern physics},
	title = {Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state},
	isbn = {978-3-540-00414-1},
	shorttitle = {Transmission electron microscopy of semiconductor nanostructures},
	number = {182},
	publisher = {Springer},
	author = {Rosenauer, Andreas},
	year = {2003},
	keywords = {21.3;21.5, Analysis, Durchstrahlungselektronenmikroskopie, Durchstrahlungselektronenspektroskopie, Halbleiter, Microscopy, Nanostruktur, Nanostrukturiertes Material, Semiconductors, Semiconductors Analysis, Semiconductors Microscopy, Transmission electron microscopy, Verbindungshalbleiter},
}

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