A New Technique for Runtime Leakage Reduction and Its Sensitivity and Parametric Yield Analysis Under Effective Channel-Length Variation

A New Technique for Runtime Leakage Reduction and Its Sensitivity and Parametric Yield Analysis Under Effective Channel-Length Variation. Roy, S. & Pal, A. J. Low Power Electron., 6(1):80–92, 2010.

Paper doi bibtex

@article{DBLP:journals/jolpe/RoyP10,
  author    = {Sudip Roy and
               Ajit Pal},
  title     = {A New Technique for Runtime Leakage Reduction and Its Sensitivity
               and Parametric Yield Analysis Under Effective Channel-Length Variation},
  journal   = {J. Low Power Electron.},
  volume    = {6},
  number    = {1},
  pages     = {80--92},
  year      = {2010},
  url       = {https://doi.org/10.1166/jolpe.2010.1058},
  doi       = {10.1166/jolpe.2010.1058},
  timestamp = {Fri, 22 May 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/jolpe/RoyP10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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