@ARTICLE{Ruben2012-my,
  title    = "{Interface location by depth sectioning using a low-angle annular
              dark field detector}",
  author   = "Ruben, Gary and Cosgriff, Eireann C and D'Alfonso, Adrian J and
              Findlay, Scott D and LeBeau, James M and Allen, Leslie J",
  journal  = "Ultramicroscopy",
  volume   =  113,
  pages    = "131--138",
  month    =  feb,
  year     =  2012,
  keywords = "Depth sectioning; Heterostructure determination; Low-angle annular
              dark field; Scanning transmission electron microscopy;LeBeau
              Group;HfO2;Depth sectioning;Heterostructure
              determination;Low-angle annular dark field;Scanning transmission
              electron microscopy;atoms;bloch wave
              analysis;contrast;crystals;debye-waller factors;part
              i;resolution;scattering;stem;transmission electron-microscopy",
  doi      = "10.1016/j.ultramic.2011.11.002",
  pmid     =  22257596
}

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