@misc{
 title = {Methodology for Integrated Failure-Cause Diagnosis with Bayesian Approach : Application to Semiconductor Manufacturing Equipment},
 type = {misc},
 year = {2014},
 source = {Second European Conference of the Prognostics and Health Management Society 2014},
 websites = {https://hal.archives-ouvertes.fr/hal-01044952/},
 id = {988ea4e4-522b-3daa-89df-0a7478850729},
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 bibtype = {misc},
 author = {Samah, Asma Abu and Shahzad, Muhammad Kashif and Zamaï, Éric and Hubac, Stephane}
}

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