A characteristic fluorescence correction factor for use in electron probe microanalysis. I. Theory. Schiebl, C., August, H., & Wernisch, J. Microscopy Microanalysis Microstructures, 2(4):413–423, 1991. ![A characteristic fluorescence correction factor for use in electron probe microanalysis. I. Theory [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex @article{schiebl_characteristic_1991-1,
title = {A characteristic fluorescence correction factor for use in electron probe microanalysis. {I}. {Theory}},
volume = {2},
issn = {1154-2799},
url = {http://www.edpsciences.org/10.1051/mmm:0199100204041300},
doi = {10.1051/mmm:0199100204041300},
number = {4},
urldate = {2017-09-03},
journal = {Microscopy Microanalysis Microstructures},
author = {Schiebl, Christian and August, Hans-Jürgen and Wernisch, Johann},
year = {1991},
pages = {413--423},
}
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