@article{journals/mr/SchlangenSKB06,
  author = {Schlangen, Rudolf and Sadewater, Peter and Kerst, Uwe and Boit, Christian},
  date = {2007-03-27},
  ee = {http://dx.doi.org/10.1016/j.microrel.2006.07.025},
  interhash = {ec24ad7a6230e6e082ae8aed8c6e00da},
  intrahash = {957d15413fc3e8447e8a2481fc8e37d3},
  journal = {Microelectronics Reliability},
  number = {9-11},
  pages = {1498-1503},
  title = {Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node.},
  url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#SchlangenSKB06},
  volume = 46,
  year = 2006
}

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