Measuring a Small Number of Samples, and the 3v Fallacy: Shedding Light on Confidence and Error Intervals. Schmid, H. & Huber, A. IEEE Solid-State Circuits Magazine, 6(2):52–58, 2014. ![Measuring a Small Number of Samples, and the 3v Fallacy: Shedding Light on Confidence and Error Intervals [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex @article{schmid_measuring_2014,
title = {Measuring a {Small} {Number} of {Samples}, and the 3v {Fallacy}: {Shedding} {Light} on {Confidence} and {Error} {Intervals}},
volume = {6},
issn = {1943-0582},
shorttitle = {Measuring a {Small} {Number} of {Samples}, and the 3v {Fallacy}},
url = {http://ieeexplore.ieee.org/document/6841797/},
doi = {10.1109/MSSC.2014.2313714},
language = {en},
number = {2},
urldate = {2018-09-11},
journal = {IEEE Solid-State Circuits Magazine},
author = {Schmid, Hanspeter and Huber, Alex},
year = {2014},
pages = {52--58},
}
Downloads: 0
{"_id":"novQQN8Bz64akiHqQ","bibbaseid":"schmid-huber-measuringasmallnumberofsamplesandthe3vfallacysheddinglightonconfidenceanderrorintervals-2014","author_short":["Schmid, H.","Huber, A."],"bibdata":{"bibtype":"article","type":"article","title":"Measuring a Small Number of Samples, and the 3v Fallacy: Shedding Light on Confidence and Error Intervals","volume":"6","issn":"1943-0582","shorttitle":"Measuring a Small Number of Samples, and the 3v Fallacy","url":"http://ieeexplore.ieee.org/document/6841797/","doi":"10.1109/MSSC.2014.2313714","language":"en","number":"2","urldate":"2018-09-11","journal":"IEEE Solid-State Circuits Magazine","author":[{"propositions":[],"lastnames":["Schmid"],"firstnames":["Hanspeter"],"suffixes":[]},{"propositions":[],"lastnames":["Huber"],"firstnames":["Alex"],"suffixes":[]}],"year":"2014","pages":"52–58","bibtex":"@article{schmid_measuring_2014,\n\ttitle = {Measuring a {Small} {Number} of {Samples}, and the 3v {Fallacy}: {Shedding} {Light} on {Confidence} and {Error} {Intervals}},\n\tvolume = {6},\n\tissn = {1943-0582},\n\tshorttitle = {Measuring a {Small} {Number} of {Samples}, and the 3v {Fallacy}},\n\turl = {http://ieeexplore.ieee.org/document/6841797/},\n\tdoi = {10.1109/MSSC.2014.2313714},\n\tlanguage = {en},\n\tnumber = {2},\n\turldate = {2018-09-11},\n\tjournal = {IEEE Solid-State Circuits Magazine},\n\tauthor = {Schmid, Hanspeter and Huber, Alex},\n\tyear = {2014},\n\tpages = {52--58},\n}\n\n","author_short":["Schmid, H.","Huber, A."],"key":"schmid_measuring_2014","id":"schmid_measuring_2014","bibbaseid":"schmid-huber-measuringasmallnumberofsamplesandthe3vfallacysheddinglightonconfidenceanderrorintervals-2014","role":"author","urls":{"Paper":"http://ieeexplore.ieee.org/document/6841797/"},"metadata":{"authorlinks":{}},"html":""},"bibtype":"article","biburl":"https://bibbase.org/zotero/sede","dataSources":["pQYee5oovEhJF75n6"],"keywords":[],"search_terms":["measuring","small","number","samples","fallacy","shedding","light","confidence","error","intervals","schmid","huber"],"title":"Measuring a Small Number of Samples, and the 3v Fallacy: Shedding Light on Confidence and Error Intervals","year":2014}