Measuring a Small Number of Samples, and the 3v Fallacy: Shedding Light on Confidence and Error Intervals. Schmid, H. & Huber, A. IEEE Solid-State Circuits Magazine, 6(2):52–58, 2014.
Paper doi bibtex @article{schmid_measuring_2014,
title = {Measuring a {Small} {Number} of {Samples}, and the 3v {Fallacy}: {Shedding} {Light} on {Confidence} and {Error} {Intervals}},
volume = {6},
issn = {1943-0582},
shorttitle = {Measuring a {Small} {Number} of {Samples}, and the 3v {Fallacy}},
url = {http://ieeexplore.ieee.org/document/6841797/},
doi = {10.1109/MSSC.2014.2313714},
language = {en},
number = {2},
urldate = {2018-09-11},
journal = {IEEE Solid-State Circuits Magazine},
author = {Schmid, Hanspeter and Huber, Alex},
year = {2014},
pages = {52--58},
}
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