Comparison of 3D surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine (IFM). Schroettner, H, Schmied, M, & Scherer, S Microchimica Acta, 155(1-2):279--284, Springer, 2006. bibtex @Article{Schroettner_2006_16374,
author = {Schroettner, H and Schmied, M and Scherer, S},
journal = {Microchimica Acta},
number = {1-2},
pages = {279--284},
publisher = {Springer},
title = {Comparison of {3D} surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine (IFM)},
volume = {155},
year = {2006},
title_with_no_special_chars = {Comparison of 3D surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine IFM}
}
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{"_id":"dyZSa4W2oLa7p2y2c","bibbaseid":"schroettner-schmied-scherer-comparisonof3dsurfacereconstructiondatafromcertifieddepthstandardsobtainedbysemandaninfinitefocusmeasurementmachineifm-2006","downloads":0,"creationDate":"2018-01-22T16:01:12.378Z","title":"Comparison of 3D surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine (IFM)","author_short":["Schroettner, H","Schmied, M","Scherer, S"],"year":2006,"bibtype":"article","biburl":"http://www.uh.edu/bti/_files/bibsync_export2018-01-19.bib","bibdata":{"bibtype":"article","type":"article","author":[{"propositions":[],"lastnames":["Schroettner"],"firstnames":["H"],"suffixes":[]},{"propositions":[],"lastnames":["Schmied"],"firstnames":["M"],"suffixes":[]},{"propositions":[],"lastnames":["Scherer"],"firstnames":["S"],"suffixes":[]}],"journal":"Microchimica Acta","number":"1-2","pages":"279--284","publisher":"Springer","title":"Comparison of 3D surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine (IFM)","volume":"155","year":"2006","title_with_no_special_chars":"Comparison of 3D surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine IFM","bibtex":"@Article{Schroettner_2006_16374,\r\n author = {Schroettner, H and Schmied, M and Scherer, S},\r\n journal = {Microchimica Acta},\r\n number = {1-2},\r\n pages = {279--284},\r\n publisher = {Springer},\r\n title = {Comparison of {3D} surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine (IFM)},\r\n volume = {155},\r\n year = {2006},\r\n title_with_no_special_chars = {Comparison of 3D surface reconstruction data from certified depth standards obtained by SEM and an infinite focus measurement machine IFM}\r\n}\r\n\r\n","author_short":["Schroettner, H","Schmied, M","Scherer, S"],"key":"Schroettner_2006_16374","id":"Schroettner_2006_16374","bibbaseid":"schroettner-schmied-scherer-comparisonof3dsurfacereconstructiondatafromcertifieddepthstandardsobtainedbysemandaninfinitefocusmeasurementmachineifm-2006","role":"author","urls":{},"downloads":0},"search_terms":["comparison","surface","reconstruction","data","certified","depth","standards","obtained","sem","infinite","focus","measurement","machine","ifm","schroettner","schmied","scherer"],"keywords":[],"authorIDs":[],"dataSources":["9cexBw6hrwgyZphZZ"]}