Biprism electron interferometry with a single atom tip source. Schütz, G., Rembold, A., Pooch, A., Meier, S., Schneeweiss, P., Rauschenbeutel, A., Günther, A., Chang, W. T., Hwang, I. S., & Stibor, A. Ultramicroscopy, 141:9–15, June, 2014. ![Biprism electron interferometry with a single atom tip source [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex Experiments with electron or ion matter waves require a coherent, monochromatic and long-term stable source with high brightness. These requirements are best fulfilled by single atom tip (SAT) field emitters. The performance of an iridium covered W(111) SAT is demonstrated and analyzed for electrons in a biprism interferometer. Furthermore we characterize the emission of the SAT in a separate field electron and field ion microscope and compare it with other emitter types. A new method is presented to fabricate the electrostatic charged biprism wire that separates and combines the matter wave. In contrast to other biprism interferometers the source and the biprism size are well defined within a few nanometers. The setup has direct applications in ion interferometry and Aharonov–Bohm physics.
@article{schutz_biprism_2014,
title = {Biprism electron interferometry with a single atom tip source},
volume = {141},
issn = {0304-3991},
url = {http://www.sciencedirect.com/science/article/pii/S0304399114000400},
doi = {10.1016/j.ultramic.2014.02.003},
abstract = {Experiments with electron or ion matter waves require a coherent, monochromatic and long-term stable source with high brightness. These requirements are best fulfilled by single atom tip (SAT) field emitters. The performance of an iridium covered W(111) SAT is demonstrated and analyzed for electrons in a biprism interferometer. Furthermore we characterize the emission of the SAT in a separate field electron and field ion microscope and compare it with other emitter types. A new method is presented to fabricate the electrostatic charged biprism wire that separates and combines the matter wave. In contrast to other biprism interferometers the source and the biprism size are well defined within a few nanometers. The setup has direct applications in ion interferometry and Aharonov–Bohm physics.},
urldate = {2014-07-01},
journal = {Ultramicroscopy},
author = {Schütz, G. and Rembold, A. and Pooch, A. and Meier, S. and Schneeweiss, P. and Rauschenbeutel, A. and Günther, A. and Chang, W. T. and Hwang, I. S. and Stibor, A.},
month = jun,
year = {2014},
keywords = {Electron interferometry, Field emission, Ion beam, Matter wave, Single atom tip, biprism},
pages = {9--15},
}
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