@inproceedings{ conf/itc/SchulzeT14,
  added-at = {2015-08-26T00:00:00.000+0200},
  author = {Schulze, John and Tally, Ryan},
  biburl = {http://www.bibsonomy.org/bibtex/2e898673c4a126271775d4e5c7296f4c4/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2014},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035295},
  interhash = {f53ee3b40af7aec7d9f273ae360a2f4b},
  intrahash = {e898673c4a126271775d4e5c7296f4c4},
  isbn = {978-1-4799-4722-5},
  keywords = {dblp},
  pages = {1-8},
  publisher = {IEEE Computer Society},
  title = {Mitigating voltage droop during scan with variable shift frequency.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#SchulzeT14},
  year = {2014}
}

{"_id":"AvXvQ3anx4fnZLkJ7","bibbaseid":"schulze-tally-mitigatingvoltagedroopduringscanwithvariableshiftfrequency-2014","downloads":0,"creationDate":"2015-09-08T15:38:34.368Z","title":"Mitigating voltage droop during scan with variable shift frequency.","author_short":["Schulze, J.","Tally, R."],"year":2014,"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/john?items=1000","bibdata":{"added-at":"2015-08-26T00:00:00.000+0200","author":["Schulze, John","Tally, Ryan"],"author_short":["Schulze, J.","Tally, R."],"bibtex":"@inproceedings{ conf/itc/SchulzeT14,\n added-at = {2015-08-26T00:00:00.000+0200},\n author = {Schulze, John and Tally, Ryan},\n biburl = {http://www.bibsonomy.org/bibtex/2e898673c4a126271775d4e5c7296f4c4/dblp},\n booktitle = {ITC},\n crossref = {conf/itc/2014},\n ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035295},\n interhash = {f53ee3b40af7aec7d9f273ae360a2f4b},\n intrahash = {e898673c4a126271775d4e5c7296f4c4},\n isbn = {978-1-4799-4722-5},\n keywords = {dblp},\n pages = {1-8},\n publisher = {IEEE Computer Society},\n title = {Mitigating voltage droop during scan with variable shift frequency.},\n url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#SchulzeT14},\n year = {2014}\n}","bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bibtex/2e898673c4a126271775d4e5c7296f4c4/dblp","booktitle":"ITC","crossref":"conf/itc/2014","ee":"http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035295","id":"conf/itc/SchulzeT14","interhash":"f53ee3b40af7aec7d9f273ae360a2f4b","intrahash":"e898673c4a126271775d4e5c7296f4c4","isbn":"978-1-4799-4722-5","key":"conf/itc/SchulzeT14","keywords":"dblp","pages":"1-8","publisher":"IEEE Computer Society","title":"Mitigating voltage droop during scan with variable shift frequency.","type":"inproceedings","url":"http://dblp.uni-trier.de/db/conf/itc/itc2014.html#SchulzeT14","year":"2014","bibbaseid":"schulze-tally-mitigatingvoltagedroopduringscanwithvariableshiftfrequency-2014","role":"author","urls":{"Link":"http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035295","Paper":"http://dblp.uni-trier.de/db/conf/itc/itc2014.html#SchulzeT14"},"keyword":["dblp"],"downloads":0},"search_terms":["mitigating","voltage","droop","during","scan","variable","shift","frequency","schulze","tally"],"keywords":["dblp"],"authorIDs":[],"dataSources":["e3DPfiLXyfZxic3k2"]}