@incollection{scott_epma_1991,
	address = {Boston, MA},
	title = {An {Epma} {Correction} {Method} {Based} upon a {Quadrilateral} ø(ρz) {Profile}},
	isbn = {978-1-4899-2617-3},
	url = {https://doi.org/10.1007/978-1-4899-2617-3_3},
	abstract = {Quantitative electron probe microanalysis (EPMA) results are obtained by comparing the intensity of a particular characteristic x-ray line from the specimen with that from a reference standard of known composition. The measured x-ray intensity ratio, k, is then related to the mass concentration, c, of the element provided that the instrumental settings are kept constant while the x-ray intensity readings are being taken. The ratio k is, however, not usually directly proportional to c and correction factors are required to take account of the different behavior of electrons and x rays in specimen and standard. We shall first identify these factors and, in doing so, provide the essential terminology.},
	language = {en},
	urldate = {2020-03-28},
	booktitle = {Electron {Probe} {Quantitation}},
	publisher = {Springer US},
	author = {Scott, V. D. and Love, G.},
	editor = {Heinrich, K. F. J. and Newbury, Dale E.},
	year = {1991},
	doi = {10.1007/978-1-4899-2617-3_3},
	note = {00000 },
	keywords = {Bethe Equation, Correction Model, Incident Electron Energy, Mass Absorption Coefficient, Root Mean Square Error},
	pages = {19--30},
}

{"_id":"czgwLLgLgMqSycmE9","bibbaseid":"scott-love-anepmacorrectionmethodbaseduponaquadrilateralzprofile-1991","author_short":["Scott, V. D.","Love, G."],"bibdata":{"bibtype":"incollection","type":"incollection","address":"Boston, MA","title":"An Epma Correction Method Based upon a Quadrilateral ø(ρz) Profile","isbn":"978-1-4899-2617-3","url":"https://doi.org/10.1007/978-1-4899-2617-3_3","abstract":"Quantitative electron probe microanalysis (EPMA) results are obtained by comparing the intensity of a particular characteristic x-ray line from the specimen with that from a reference standard of known composition. The measured x-ray intensity ratio, k, is then related to the mass concentration, c, of the element provided that the instrumental settings are kept constant while the x-ray intensity readings are being taken. The ratio k is, however, not usually directly proportional to c and correction factors are required to take account of the different behavior of electrons and x rays in specimen and standard. We shall first identify these factors and, in doing so, provide the essential terminology.","language":"en","urldate":"2020-03-28","booktitle":"Electron Probe Quantitation","publisher":"Springer US","author":[{"propositions":[],"lastnames":["Scott"],"firstnames":["V.","D."],"suffixes":[]},{"propositions":[],"lastnames":["Love"],"firstnames":["G."],"suffixes":[]}],"editor":[{"propositions":[],"lastnames":["Heinrich"],"firstnames":["K.","F.","J."],"suffixes":[]},{"propositions":[],"lastnames":["Newbury"],"firstnames":["Dale","E."],"suffixes":[]}],"year":"1991","doi":"10.1007/978-1-4899-2617-3_3","note":"00000 ","keywords":"Bethe Equation, Correction Model, Incident Electron Energy, Mass Absorption Coefficient, Root Mean Square Error","pages":"19–30","bibtex":"@incollection{scott_epma_1991,\n\taddress = {Boston, MA},\n\ttitle = {An {Epma} {Correction} {Method} {Based} upon a {Quadrilateral} ø(ρz) {Profile}},\n\tisbn = {978-1-4899-2617-3},\n\turl = {https://doi.org/10.1007/978-1-4899-2617-3_3},\n\tabstract = {Quantitative electron probe microanalysis (EPMA) results are obtained by comparing the intensity of a particular characteristic x-ray line from the specimen with that from a reference standard of known composition. The measured x-ray intensity ratio, k, is then related to the mass concentration, c, of the element provided that the instrumental settings are kept constant while the x-ray intensity readings are being taken. The ratio k is, however, not usually directly proportional to c and correction factors are required to take account of the different behavior of electrons and x rays in specimen and standard. We shall first identify these factors and, in doing so, provide the essential terminology.},\n\tlanguage = {en},\n\turldate = {2020-03-28},\n\tbooktitle = {Electron {Probe} {Quantitation}},\n\tpublisher = {Springer US},\n\tauthor = {Scott, V. D. and Love, G.},\n\teditor = {Heinrich, K. F. J. and Newbury, Dale E.},\n\tyear = {1991},\n\tdoi = {10.1007/978-1-4899-2617-3_3},\n\tnote = {00000 },\n\tkeywords = {Bethe Equation, Correction Model, Incident Electron Energy, Mass Absorption Coefficient, Root Mean Square Error},\n\tpages = {19--30},\n}\n\n","author_short":["Scott, V. D.","Love, G."],"editor_short":["Heinrich, K. F. J.","Newbury, D. E."],"key":"scott_epma_1991","id":"scott_epma_1991","bibbaseid":"scott-love-anepmacorrectionmethodbaseduponaquadrilateralzprofile-1991","role":"author","urls":{"Paper":"https://doi.org/10.1007/978-1-4899-2617-3_3"},"keyword":["Bethe Equation","Correction Model","Incident Electron Energy","Mass Absorption Coefficient","Root Mean Square Error"],"metadata":{"authorlinks":{}}},"bibtype":"incollection","biburl":"https://bibbase.org/zotero/ricounet67","dataSources":["rx3H6duFmTt3xD5yy"],"keywords":["bethe equation","correction model","incident electron energy","mass absorption coefficient","root mean square error"],"search_terms":["epma","correction","method","based","upon","quadrilateral","profile","scott","love"],"title":"An Epma Correction Method Based upon a Quadrilateral ø(ρz) Profile","year":1991}