@inproceedings{conf/irps/SeokKYLK18,
  added-at = {2019-01-22T00:00:00.000+0100},
  author = {Seok, Mingoo and Kinget, Peter R. and Yang, Teng and Li, Jiangyi and Kim, Doyun},
  biburl = {https://www.bibsonomy.org/bibtex/2cf671db8ba6d370cb1a60191d2f36d21/dblp},
  booktitle = {IRPS},
  crossref = {conf/irps/2018},
  ee = {https://doi.org/10.1109/IRPS.2018.8353612},
  interhash = {c8dae501f08c717196b14ba4dd432834},
  intrahash = {cf671db8ba6d370cb1a60191d2f36d21},
  isbn = {978-1-5386-5479-8},
  keywords = {dblp},
  pages = 5,
  publisher = {IEEE},
  timestamp = {2019-01-23T11:37:34.000+0100},
  title = {Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper.},
  url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#SeokKYLK18},
  year = 2018
}

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