On Evaluation of Parametric Yield for an Operational Transconductance Amplifier (OTA). Sharma, H., K., Bhargava, L., & Sahula, V. In 6th IEEE VLSI Design and Test Workshops, 2002.
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@inproceedings{
 title = {On Evaluation of Parametric Yield for an Operational Transconductance Amplifier (OTA)},
 type = {inproceedings},
 year = {2002},
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 created = {2014-04-17T21:17:22.000Z},
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 last_modified = {2017-03-14T01:22:09.162Z},
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 citation_key = {h2002evaluation},
 source_type = {inproceedings},
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 bibtype = {inproceedings},
 author = {Sharma, H K and Bhargava, L and Sahula, V},
 booktitle = {6th IEEE VLSI Design and Test Workshops}
}

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