Measurement-based modeling and analysis methodology for characterizing parallel I/O performance. Sharma, S. & Iyer, R. K. In 5th International Conference On High Performance Computing, HiPC 1998, Madras, India, 20-20 December, 1998, pages 391–398, 1998.
Measurement-based modeling and analysis methodology for characterizing parallel I/O performance [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/hipc/SharmaI98,
  author    = {Sanjay Sharma and
               Ravishankar Krishnan Iyer},
  title     = {Measurement-based modeling and analysis methodology for characterizing
               parallel {I/O} performance},
  booktitle = {5th International Conference On High Performance Computing, HiPC 1998,
               Madras, India, 20-20 December, 1998},
  pages     = {391--398},
  year      = {1998},
  crossref  = {DBLP:conf/hipc/1998},
  url       = {https://doi.org/10.1109/HIPC.1998.738013},
  doi       = {10.1109/HIPC.1998.738013},
  timestamp = {Fri, 26 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/hipc/SharmaI98},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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