X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. Sharma, A., Jayasumana, A. P., & Malaiya, Y. K. In VTS, pages 180-185, 2006. IEEE Computer Society.
X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. [link]Link  X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. [link]Paper  bibtex   
@inproceedings{ conf/vts/SharmaJM06,
  added-at = {2006-05-31T00:00:00.000+0200},
  author = {Sharma, Ashutosh and Jayasumana, Anura P. and Malaiya, Yashwant K.},
  biburl = {http://www.bibsonomy.org/bibtex/248fd4f7835e96fa27710b5e763293f02/dblp},
  booktitle = {VTS},
  crossref = {conf/vts/2006},
  date = {2006-05-31},
  description = {dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.90},
  interhash = {6071d320d1499efbb0712ac72c13c8e5},
  intrahash = {48fd4f7835e96fa27710b5e763293f02},
  isbn = {0-7695-2514-8},
  keywords = {dblp},
  pages = {180-185},
  publisher = {IEEE Computer Society},
  title = {X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data.},
  url = {http://dblp.uni-trier.de/db/conf/vts/vts2006.html#SharmaJM06},
  year = {2006}
}

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