Error Model Guided Joint Performance and Endurance Optimization for Flash Memory. Shi, L., Qiu, K., Zhao, M., & Xue, C. J. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 33(3):343–355, 2014.
Error Model Guided Joint Performance and Endurance Optimization for Flash Memory [link]Paper  doi  bibtex   
@article{DBLP:journals/tcad/ShiQZX14,
  author       = {Liang Shi and
                  Keni Qiu and
                  Mengying Zhao and
                  Chun Jason Xue},
  title        = {Error Model Guided Joint Performance and Endurance Optimization for
                  Flash Memory},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {33},
  number       = {3},
  pages        = {343--355},
  year         = {2014},
  url          = {https://doi.org/10.1109/TCAD.2013.2288691},
  doi          = {10.1109/TCAD.2013.2288691},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/ShiQZX14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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