Analysing MTL Properties using NuSMV model checker. Shreya, V & Nanda, M. In pages 817–820, 2017. IEEE.
doi  bibtex   
@inproceedings{shreya_analysing_2017,
	title = {Analysing {MTL} {Properties} using {NuSMV} model checker},
	doi = {10/gh3pkh},
	language = {English},
	publisher = {IEEE},
	author = {Shreya, V and Nanda, Manju},
	year = {2017},
	keywords = {Electronics and Electrical Engineering, ⛔ No DOI found},
	pages = {817--820},
}

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