Analysing MTL Properties using NuSMV model checker. Shreya, V & Nanda, M. In pages 817–820, 2017. IEEE. doi bibtex @inproceedings{shreya_analysing_2017,
title = {Analysing {MTL} {Properties} using {NuSMV} model checker},
doi = {10/gh3pkh},
language = {English},
publisher = {IEEE},
author = {Shreya, V and Nanda, Manju},
year = {2017},
keywords = {Electronics and Electrical Engineering, ⛔ No DOI found},
pages = {817--820},
}
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