@inproceedings{DBLP:conf/dft/SiddiquaSRDFLBG17,
  author    = {Taniya Siddiqua and
               Vilas Sridharan and
               Steven E. Raasch and
               Nathan DeBardeleben and
               Kurt B. Ferreira and
               Scott Levy and
               Elisabeth Baseman and
               Qiang Guan},
  title     = {Lifetime memory reliability data from the field},
  booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
               and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
               October 23-25, 2017},
  pages     = {1--6},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {https://doi.org/10.1109/DFT.2017.8244428},
  doi       = {10.1109/DFT.2017.8244428},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/conf/dft/SiddiquaSRDFLBG17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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