Lifetime memory reliability data from the field. Siddiqua, T., Sridharan, V., Raasch, S. E., DeBardeleben, N., Ferreira, K. B., Levy, S., Baseman, E., & Guan, Q. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pages 1–6, 2017. IEEE Computer Society. Paper doi bibtex @inproceedings{DBLP:conf/dft/SiddiquaSRDFLBG17,
author = {Taniya Siddiqua and
Vilas Sridharan and
Steven E. Raasch and
Nathan DeBardeleben and
Kurt B. Ferreira and
Scott Levy and
Elisabeth Baseman and
Qiang Guan},
title = {Lifetime memory reliability data from the field},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
October 23-25, 2017},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/DFT.2017.8244428},
doi = {10.1109/DFT.2017.8244428},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/dft/SiddiquaSRDFLBG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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