OO-Metriken zeigen große Qualitätspotenziale in komplexen Softwaresystemen. Simon, F. and Meyerhoff, D. 2002.
bibtex   
@misc{Simon2002,
annote = {Objectspektrum},
author = {Simon, Frank and Meyerhoff, Dirk},
keywords = {Ordner-H},
mendeley-tags = {Ordner-H},
title = {{OO-Metriken zeigen gro{\ss}e Qualit{\"{a}}tspotenziale in komplexen Softwaresystemen}},
volume = {6},
year = {2002}
}
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