@incollection{small_f_1991,
	address = {Boston, MA},
	title = {The f(χ) {Machine}: {An} {Experimental} {Bench} for the {Measurement} of {Electron} {Probe} {Parameters}},
	isbn = {978-1-4899-2617-3},
	shorttitle = {The f(χ) {Machine}},
	url = {https://doi.org/10.1007/978-1-4899-2617-3_16},
	abstract = {In routine electron probe analysis involving sample targets that are electron opaque, flat, and conductive, the mechanisms describing the interaction of the beam electrons with the target atoms and the subsequent x-ray generation, absorption, and detection are well known. Various correction procedures are currently available for routine quantitative analysis that offer accuracies of 2 percent relative, as determined from studies of well-characterized, homogeneous standards [1].},
	language = {en},
	urldate = {2020-03-28},
	booktitle = {Electron {Probe} {Quantitation}},
	publisher = {Springer US},
	author = {Small, J. A. and Newbury, D. E. and Myklebust, R. L. and Fiori, C. E. and Bell, A. A. and Heinrich, K. F. J.},
	editor = {Heinrich, K. F. J. and Newbury, Dale E.},
	year = {1991},
	doi = {10.1007/978-1-4899-2617-3_16},
	note = {00000 },
	keywords = {Beam Energy, Emergence Angle, High Absorption Region, Quadratic Model, Residual Plot},
	pages = {317--334},
}

{"_id":"w9hXuM9w4r4PBz2Er","bibbaseid":"small-newbury-myklebust-fiori-bell-heinrich-thefmachineanexperimentalbenchforthemeasurementofelectronprobeparameters-1991","author_short":["Small, J. A.","Newbury, D. E.","Myklebust, R. L.","Fiori, C. E.","Bell, A. A.","Heinrich, K. F. J."],"bibdata":{"bibtype":"incollection","type":"incollection","address":"Boston, MA","title":"The f(χ) Machine: An Experimental Bench for the Measurement of Electron Probe Parameters","isbn":"978-1-4899-2617-3","shorttitle":"The f(χ) Machine","url":"https://doi.org/10.1007/978-1-4899-2617-3_16","abstract":"In routine electron probe analysis involving sample targets that are electron opaque, flat, and conductive, the mechanisms describing the interaction of the beam electrons with the target atoms and the subsequent x-ray generation, absorption, and detection are well known. Various correction procedures are currently available for routine quantitative analysis that offer accuracies of 2 percent relative, as determined from studies of well-characterized, homogeneous standards [1].","language":"en","urldate":"2020-03-28","booktitle":"Electron Probe Quantitation","publisher":"Springer US","author":[{"propositions":[],"lastnames":["Small"],"firstnames":["J.","A."],"suffixes":[]},{"propositions":[],"lastnames":["Newbury"],"firstnames":["D.","E."],"suffixes":[]},{"propositions":[],"lastnames":["Myklebust"],"firstnames":["R.","L."],"suffixes":[]},{"propositions":[],"lastnames":["Fiori"],"firstnames":["C.","E."],"suffixes":[]},{"propositions":[],"lastnames":["Bell"],"firstnames":["A.","A."],"suffixes":[]},{"propositions":[],"lastnames":["Heinrich"],"firstnames":["K.","F.","J."],"suffixes":[]}],"editor":[{"propositions":[],"lastnames":["Heinrich"],"firstnames":["K.","F.","J."],"suffixes":[]},{"propositions":[],"lastnames":["Newbury"],"firstnames":["Dale","E."],"suffixes":[]}],"year":"1991","doi":"10.1007/978-1-4899-2617-3_16","note":"00000 ","keywords":"Beam Energy, Emergence Angle, High Absorption Region, Quadratic Model, Residual Plot","pages":"317–334","bibtex":"@incollection{small_f_1991,\n\taddress = {Boston, MA},\n\ttitle = {The f(χ) {Machine}: {An} {Experimental} {Bench} for the {Measurement} of {Electron} {Probe} {Parameters}},\n\tisbn = {978-1-4899-2617-3},\n\tshorttitle = {The f(χ) {Machine}},\n\turl = {https://doi.org/10.1007/978-1-4899-2617-3_16},\n\tabstract = {In routine electron probe analysis involving sample targets that are electron opaque, flat, and conductive, the mechanisms describing the interaction of the beam electrons with the target atoms and the subsequent x-ray generation, absorption, and detection are well known. Various correction procedures are currently available for routine quantitative analysis that offer accuracies of 2 percent relative, as determined from studies of well-characterized, homogeneous standards [1].},\n\tlanguage = {en},\n\turldate = {2020-03-28},\n\tbooktitle = {Electron {Probe} {Quantitation}},\n\tpublisher = {Springer US},\n\tauthor = {Small, J. A. and Newbury, D. E. and Myklebust, R. L. and Fiori, C. E. and Bell, A. A. and Heinrich, K. F. J.},\n\teditor = {Heinrich, K. F. J. and Newbury, Dale E.},\n\tyear = {1991},\n\tdoi = {10.1007/978-1-4899-2617-3_16},\n\tnote = {00000 },\n\tkeywords = {Beam Energy, Emergence Angle, High Absorption Region, Quadratic Model, Residual Plot},\n\tpages = {317--334},\n}\n\n","author_short":["Small, J. A.","Newbury, D. E.","Myklebust, R. L.","Fiori, C. E.","Bell, A. A.","Heinrich, K. F. J."],"editor_short":["Heinrich, K. F. J.","Newbury, D. E."],"key":"small_f_1991","id":"small_f_1991","bibbaseid":"small-newbury-myklebust-fiori-bell-heinrich-thefmachineanexperimentalbenchforthemeasurementofelectronprobeparameters-1991","role":"author","urls":{"Paper":"https://doi.org/10.1007/978-1-4899-2617-3_16"},"keyword":["Beam Energy","Emergence Angle","High Absorption Region","Quadratic Model","Residual Plot"],"metadata":{"authorlinks":{}}},"bibtype":"incollection","biburl":"https://bibbase.org/zotero/ricounet67","dataSources":["rx3H6duFmTt3xD5yy"],"keywords":["beam energy","emergence angle","high absorption region","quadratic model","residual plot"],"search_terms":["machine","experimental","bench","measurement","electron","probe","parameters","small","newbury","myklebust","fiori","bell","heinrich"],"title":"The f(χ) Machine: An Experimental Bench for the Measurement of Electron Probe Parameters","year":1991}