Deep Metric Learning via Facility Location. Song, H. O., Jegelka, S., Rathod, V., & Murphy, K. In International Conference on Computer Vision and Pattern Recognition (CVPR), 2017. Pdf bibtex @InProceedings{song17,
author = {Hyun Oh Song and Stefanie Jegelka and Vivek Rathod and Kevin Murphy},
title = {Deep Metric Learning via Facility Location},
booktitle = {International Conference on Computer Vision and Pattern Recognition (CVPR)},
year = 2017,
url_pdf = {http://openaccess.thecvf.com/content_cvpr_2017/papers/Song_Deep_Metric_Learning_CVPR_2017_paper.pdf}}
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