@inproceedings{
 title = {Reliability Evaluation of Redundancy based Fault Tolerant Techniques at Nanoscale},
 type = {inproceedings},
 year = {2012},
 id = {2bb1dfd0-eadc-3b73-8df9-189fdfd5efa5},
 created = {2014-04-17T21:17:22.000Z},
 file_attached = {false},
 profile_id = {03d2ca17-6bde-3cfe-95de-fcbe4f21507b},
 last_modified = {2017-03-14T01:22:09.162Z},
 read = {false},
 starred = {false},
 authored = {true},
 confirmed = {true},
 hidden = {false},
 citation_key = {soni2012rasdat},
 source_type = {inproceedings},
 private_publication = {false},
 bibtype = {inproceedings},
 author = {Soni, Mahesh and Kumawat, R and Sahula, V and Gaur, M S},
 booktitle = {3rd IEEE Workshop Reliability Aware System Design and Test}
}

{"_id":"Pxg2FQ8cNjk2uTXsZ","bibbaseid":"soni-kumawat-sahula-gaur-reliabilityevaluationofredundancybasedfaulttoleranttechniquesatnanoscale-2012","author_short":["Soni, M.","Kumawat, R.","Sahula, V.","Gaur, M., S."],"bibdata":{"title":"Reliability Evaluation of Redundancy based Fault Tolerant Techniques at Nanoscale","type":"inproceedings","year":"2012","id":"2bb1dfd0-eadc-3b73-8df9-189fdfd5efa5","created":"2014-04-17T21:17:22.000Z","file_attached":false,"profile_id":"03d2ca17-6bde-3cfe-95de-fcbe4f21507b","last_modified":"2017-03-14T01:22:09.162Z","read":false,"starred":false,"authored":"true","confirmed":"true","hidden":false,"citation_key":"soni2012rasdat","source_type":"inproceedings","private_publication":false,"bibtype":"inproceedings","author":"Soni, Mahesh and Kumawat, R and Sahula, V and Gaur, M S","booktitle":"3rd IEEE Workshop Reliability Aware System Design and Test","bibtex":"@inproceedings{\n title = {Reliability Evaluation of Redundancy based Fault Tolerant Techniques at Nanoscale},\n type = {inproceedings},\n year = {2012},\n id = {2bb1dfd0-eadc-3b73-8df9-189fdfd5efa5},\n created = {2014-04-17T21:17:22.000Z},\n file_attached = {false},\n profile_id = {03d2ca17-6bde-3cfe-95de-fcbe4f21507b},\n last_modified = {2017-03-14T01:22:09.162Z},\n read = {false},\n starred = {false},\n authored = {true},\n confirmed = {true},\n hidden = {false},\n citation_key = {soni2012rasdat},\n source_type = {inproceedings},\n private_publication = {false},\n bibtype = {inproceedings},\n author = {Soni, Mahesh and Kumawat, R and Sahula, V and Gaur, M S},\n booktitle = {3rd IEEE Workshop Reliability Aware System Design and Test}\n}","author_short":["Soni, M.","Kumawat, R.","Sahula, V.","Gaur, M., S."],"biburl":"https://bibbase.org/service/mendeley/03d2ca17-6bde-3cfe-95de-fcbe4f21507b","bibbaseid":"soni-kumawat-sahula-gaur-reliabilityevaluationofredundancybasedfaulttoleranttechniquesatnanoscale-2012","role":"author","urls":{},"metadata":{"authorlinks":{}}},"bibtype":"inproceedings","biburl":"https://bibbase.org/service/mendeley/03d2ca17-6bde-3cfe-95de-fcbe4f21507b","dataSources":["YNoDN2TgaRvNK6vy3","ya2CyA73rpZseyrZ8"],"keywords":[],"search_terms":["reliability","evaluation","redundancy","based","fault","tolerant","techniques","nanoscale","soni","kumawat","sahula","gaur"],"title":"Reliability Evaluation of Redundancy based Fault Tolerant Techniques at Nanoscale","year":2012}