Electron source brightness and degeneracy from Fresnel fringes in field emission point projection microscopy. Spence, J. C. H., Qian, W., & Silverman, M. P. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 12(2):542–547, March, 1994. ![Electron source brightness and degeneracy from Fresnel fringes in field emission point projection microscopy [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex @article{spence_electron_1994,
title = {Electron source brightness and degeneracy from {Fresnel} fringes in field emission point projection microscopy},
volume = {12},
url = {http://link.aip.org/link/?JVA/12/542/1},
doi = {10.1116/1.579166},
number = {2},
urldate = {2009-05-05},
journal = {Journal of Vacuum Science \& Technology A: Vacuum, Surfaces, and Films},
author = {Spence, J. C. H. and Qian, W. and Silverman, M. P.},
month = mar,
year = {1994},
keywords = {DEFOCUSING, ELECTRON MICROSCOPES, Electron sources, FRESNEL DIFFRACTION, HOLOGRAPHY, IMAGE FORMING, INTERFERENCE, RESOLUTION, brightness},
pages = {542--547},
}
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