@incollection{Spurgeon2017,
author = {Spurgeon, S.R. and Chambers, S.A.},
booktitle = {Reference Module in Chemistry, Molecular Sciences and Chemical Engineering},
doi = {10.1016/B978-0-12-409547-2.12877-X},
file = {:Users/spur391/Google Drive/Literature/Spurgeon, Chambers/Reference Module in Chemistry, Molecular Sciences and Chemical Engineering/Spurgeon, Chambers - 2017 - Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Mic.pdf:pdf},
isbn = {9780124095472},
keywords = {Chemistry,Composition,Density functional theory,Electron energy loss spectroscopy,Emergent properties,Energy-dispersive X-ray spectroscopy,High-angle annular dark field,Interfaces,Multislice simulation,Oxides,Phases,Scanning transmission electron microscopy,Superlattices,Thin films,Valence},
pages = {1--11},
publisher = {Elsevier},
title = {{Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy}},
url = {http://linkinghub.elsevier.com/retrieve/pii/B978012409547212877X},
year = {2017}
}

{"_id":"o9KADcWhk7btAKcmb","bibbaseid":"spurgeon-chambers-atomicscalecharacterizationofoxideinterfacesandsuperlatticesusingscanningtransmissionelectronmicroscopy-2017","authorIDs":[],"author_short":["Spurgeon, S.","Chambers, S."],"bibdata":{"bibtype":"incollection","type":"incollection","author":[{"propositions":[],"lastnames":["Spurgeon"],"firstnames":["S.R."],"suffixes":[]},{"propositions":[],"lastnames":["Chambers"],"firstnames":["S.A."],"suffixes":[]}],"booktitle":"Reference Module in Chemistry, Molecular Sciences and Chemical Engineering","doi":"10.1016/B978-0-12-409547-2.12877-X","file":":Users/spur391/Google Drive/Literature/Spurgeon, Chambers/Reference Module in Chemistry, Molecular Sciences and Chemical Engineering/Spurgeon, Chambers - 2017 - Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Mic.pdf:pdf","isbn":"9780124095472","keywords":"Chemistry,Composition,Density functional theory,Electron energy loss spectroscopy,Emergent properties,Energy-dispersive X-ray spectroscopy,High-angle annular dark field,Interfaces,Multislice simulation,Oxides,Phases,Scanning transmission electron microscopy,Superlattices,Thin films,Valence","pages":"1–11","publisher":"Elsevier","title":"Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy","url":"http://linkinghub.elsevier.com/retrieve/pii/B978012409547212877X","year":"2017","bibtex":"@incollection{Spurgeon2017,\nauthor = {Spurgeon, S.R. and Chambers, S.A.},\nbooktitle = {Reference Module in Chemistry, Molecular Sciences and Chemical Engineering},\ndoi = {10.1016/B978-0-12-409547-2.12877-X},\nfile = {:Users/spur391/Google Drive/Literature/Spurgeon, Chambers/Reference Module in Chemistry, Molecular Sciences and Chemical Engineering/Spurgeon, Chambers - 2017 - Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Mic.pdf:pdf},\nisbn = {9780124095472},\nkeywords = {Chemistry,Composition,Density functional theory,Electron energy loss spectroscopy,Emergent properties,Energy-dispersive X-ray spectroscopy,High-angle annular dark field,Interfaces,Multislice simulation,Oxides,Phases,Scanning transmission electron microscopy,Superlattices,Thin films,Valence},\npages = {1--11},\npublisher = {Elsevier},\ntitle = {{Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy}},\nurl = {http://linkinghub.elsevier.com/retrieve/pii/B978012409547212877X},\nyear = {2017}\n}\n","author_short":["Spurgeon, S.","Chambers, S."],"key":"Spurgeon2017","id":"Spurgeon2017","bibbaseid":"spurgeon-chambers-atomicscalecharacterizationofoxideinterfacesandsuperlatticesusingscanningtransmissionelectronmicroscopy-2017","role":"author","urls":{"Paper":"http://linkinghub.elsevier.com/retrieve/pii/B978012409547212877X"},"keyword":["Chemistry","Composition","Density functional theory","Electron energy loss spectroscopy","Emergent properties","Energy-dispersive X-ray spectroscopy","High-angle annular dark field","Interfaces","Multislice simulation","Oxides","Phases","Scanning transmission electron microscopy","Superlattices","Thin films","Valence"],"downloads":0},"bibtype":"incollection","biburl":"http://www.stevenspurgeon.com/s/Test.bib","creationDate":"2019-09-01T00:07:53.042Z","downloads":0,"keywords":["chemistry","composition","density functional theory","electron energy loss spectroscopy","emergent properties","energy-dispersive x-ray spectroscopy","high-angle annular dark field","interfaces","multislice simulation","oxides","phases","scanning transmission electron microscopy","superlattices","thin films","valence"],"search_terms":["atomic","scale","characterization","oxide","interfaces","superlattices","using","scanning","transmission","electron","microscopy","spurgeon","chambers"],"title":"Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy","year":2017,"dataSources":["Ds9m7qjPFYCFB4b6R"]}