Algorithmic Error Correction of Impedance Measuring Sensors. Starostenko, O., Alarcon-Aquino, V., Hernandez, W., Sergiyenko, O., & Tyrsa, V. Sensors, 9(12):10341-10355, 12, 2009. Website doi abstract bibtex 2 downloads This paper describes novel design concepts and some advanced techniques proposed for increasing the accuracy of low cost impedance measuring devices without reduction of operational speed. The proposed structural method for algorithmic error correction and iterating correction method provide linearization of transfer functions of the measuring sensor and signal conditioning converter, which contribute the principal additive and relative measurement errors. Some measuring systems have been implemented in order to estimate in practice the performance of the proposed methods. Particularly, a measuring system for analysis of C-V, G-V characteristics has been designed and constructed. It has been tested during technological process control of charge-coupled device CCD manufacturing. The obtained results are discussed in order to define a reasonable range of applied methods, their utility, and performance. © 2009 by the authors.
@article{
title = {Algorithmic Error Correction of Impedance Measuring Sensors},
type = {article},
year = {2009},
keywords = {C-v,Error correction,G-v characteristic meter,Impedance measuring sensor},
pages = {10341-10355},
volume = {9},
websites = {http://www.mdpi.com/1424-8220/9/12/10341},
month = {12},
day = {21},
id = {1213141d-f3ae-352d-b147-27d3bfd2441e},
created = {2022-08-29T17:43:23.807Z},
file_attached = {false},
profile_id = {940dd160-7d67-3a5f-b9f8-935da0571367},
group_id = {92fccab2-8d44-33bc-b301-7b94bb18523c},
last_modified = {2022-08-29T17:43:23.807Z},
read = {false},
starred = {false},
authored = {false},
confirmed = {true},
hidden = {false},
private_publication = {false},
abstract = {This paper describes novel design concepts and some advanced techniques proposed for increasing the accuracy of low cost impedance measuring devices without reduction of operational speed. The proposed structural method for algorithmic error correction and iterating correction method provide linearization of transfer functions of the measuring sensor and signal conditioning converter, which contribute the principal additive and relative measurement errors. Some measuring systems have been implemented in order to estimate in practice the performance of the proposed methods. Particularly, a measuring system for analysis of C-V, G-V characteristics has been designed and constructed. It has been tested during technological process control of charge-coupled device CCD manufacturing. The obtained results are discussed in order to define a reasonable range of applied methods, their utility, and performance. © 2009 by the authors.},
bibtype = {article},
author = {Starostenko, Oleg and Alarcon-Aquino, Vicente and Hernandez, Wilmar and Sergiyenko, Oleg and Tyrsa, Vira},
doi = {10.3390/s91210341},
journal = {Sensors},
number = {12}
}
Downloads: 2
{"_id":"B98oeNmKkW3z7FtrD","bibbaseid":"starostenko-alarconaquino-hernandez-sergiyenko-tyrsa-algorithmicerrorcorrectionofimpedancemeasuringsensors-2009","downloads":2,"creationDate":"2018-11-16T02:20:24.889Z","title":"Algorithmic Error Correction of Impedance Measuring Sensors","author_short":["Starostenko, O.","Alarcon-Aquino, V.","Hernandez, W.","Sergiyenko, O.","Tyrsa, V."],"year":2009,"bibtype":"article","biburl":"https://bibbase.org/service/mendeley/940dd160-7d67-3a5f-b9f8-935da0571367","bibdata":{"title":"Algorithmic Error Correction of Impedance Measuring Sensors","type":"article","year":"2009","keywords":"C-v,Error correction,G-v characteristic meter,Impedance measuring sensor","pages":"10341-10355","volume":"9","websites":"http://www.mdpi.com/1424-8220/9/12/10341","month":"12","day":"21","id":"1213141d-f3ae-352d-b147-27d3bfd2441e","created":"2022-08-29T17:43:23.807Z","file_attached":false,"profile_id":"940dd160-7d67-3a5f-b9f8-935da0571367","group_id":"92fccab2-8d44-33bc-b301-7b94bb18523c","last_modified":"2022-08-29T17:43:23.807Z","read":false,"starred":false,"authored":false,"confirmed":"true","hidden":false,"private_publication":false,"abstract":"This paper describes novel design concepts and some advanced techniques proposed for increasing the accuracy of low cost impedance measuring devices without reduction of operational speed. The proposed structural method for algorithmic error correction and iterating correction method provide linearization of transfer functions of the measuring sensor and signal conditioning converter, which contribute the principal additive and relative measurement errors. Some measuring systems have been implemented in order to estimate in practice the performance of the proposed methods. Particularly, a measuring system for analysis of C-V, G-V characteristics has been designed and constructed. It has been tested during technological process control of charge-coupled device CCD manufacturing. The obtained results are discussed in order to define a reasonable range of applied methods, their utility, and performance. © 2009 by the authors.","bibtype":"article","author":"Starostenko, Oleg and Alarcon-Aquino, Vicente and Hernandez, Wilmar and Sergiyenko, Oleg and Tyrsa, Vira","doi":"10.3390/s91210341","journal":"Sensors","number":"12","bibtex":"@article{\n title = {Algorithmic Error Correction of Impedance Measuring Sensors},\n type = {article},\n year = {2009},\n keywords = {C-v,Error correction,G-v characteristic meter,Impedance measuring sensor},\n pages = {10341-10355},\n volume = {9},\n websites = {http://www.mdpi.com/1424-8220/9/12/10341},\n month = {12},\n day = {21},\n id = {1213141d-f3ae-352d-b147-27d3bfd2441e},\n created = {2022-08-29T17:43:23.807Z},\n file_attached = {false},\n profile_id = {940dd160-7d67-3a5f-b9f8-935da0571367},\n group_id = {92fccab2-8d44-33bc-b301-7b94bb18523c},\n last_modified = {2022-08-29T17:43:23.807Z},\n read = {false},\n starred = {false},\n authored = {false},\n confirmed = {true},\n hidden = {false},\n private_publication = {false},\n abstract = {This paper describes novel design concepts and some advanced techniques proposed for increasing the accuracy of low cost impedance measuring devices without reduction of operational speed. The proposed structural method for algorithmic error correction and iterating correction method provide linearization of transfer functions of the measuring sensor and signal conditioning converter, which contribute the principal additive and relative measurement errors. Some measuring systems have been implemented in order to estimate in practice the performance of the proposed methods. Particularly, a measuring system for analysis of C-V, G-V characteristics has been designed and constructed. It has been tested during technological process control of charge-coupled device CCD manufacturing. The obtained results are discussed in order to define a reasonable range of applied methods, their utility, and performance. © 2009 by the authors.},\n bibtype = {article},\n author = {Starostenko, Oleg and Alarcon-Aquino, Vicente and Hernandez, Wilmar and Sergiyenko, Oleg and Tyrsa, Vira},\n doi = {10.3390/s91210341},\n journal = {Sensors},\n number = {12}\n}","author_short":["Starostenko, O.","Alarcon-Aquino, V.","Hernandez, W.","Sergiyenko, O.","Tyrsa, V."],"urls":{"Website":"http://www.mdpi.com/1424-8220/9/12/10341"},"biburl":"https://bibbase.org/service/mendeley/940dd160-7d67-3a5f-b9f8-935da0571367","bibbaseid":"starostenko-alarconaquino-hernandez-sergiyenko-tyrsa-algorithmicerrorcorrectionofimpedancemeasuringsensors-2009","role":"author","keyword":["C-v","Error correction","G-v characteristic meter","Impedance measuring sensor"],"metadata":{"authorlinks":{}},"downloads":2},"search_terms":["algorithmic","error","correction","impedance","measuring","sensors","starostenko","alarcon-aquino","hernandez","sergiyenko","tyrsa"],"keywords":["c-v","error correction","g-v characteristic meter","impedance measuring sensor"],"authorIDs":[],"dataSources":["uTykyhFv6T7J2dX6z","ya2CyA73rpZseyrZ8","nyWSrx2yzJEsoe49A","2252seNhipfTmjEBQ"]}