Advanced methods for algorithmic corrections of errors in immitance measurement. Starostenko, O., Rodriguez-Asomoza, J., & Alarcon-Aquino, V. In 2008 7th International Caribbean Conference on Devices, Circuits and Systems, pages 1-5, 4, 2008. IEEE. ![Advanced methods for algorithmic corrections of errors in immitance measurement [link]](https://bibbase.org/img/filetypes/link.svg "link")
Website doi abstract bibtex This paper presents an analysis of some design concepts and development of advanced techniques for incrementing speed and accuracy of CLR meters of low cost. Some measuring systems have been designed in order to estimate performance of novel approaches, such as a structural method of error correction and iterating correction method of errors in immitance measurement. The expressions of functional conversion (transfer functions) and block diagrams of designed equipment are presented and discussed for these algorithmic methods. Using the best iterating correction method the E7-13a LCR meter has been designed and tested for estimation of its accuracy and speed during measurement of capacitance, inductance, resistance, and conductance. The obtained results are evaluated to define efficiency of proposed methods, their utility and performance. These results encourage more researches in this open problem of immitance measurement. ©2008 IEEE.
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abstract = {This paper presents an analysis of some design concepts and development of advanced techniques for incrementing speed and accuracy of CLR meters of low cost. Some measuring systems have been designed in order to estimate performance of novel approaches, such as a structural method of error correction and iterating correction method of errors in immitance measurement. The expressions of functional conversion (transfer functions) and block diagrams of designed equipment are presented and discussed for these algorithmic methods. Using the best iterating correction method the E7-13a LCR meter has been designed and tested for estimation of its accuracy and speed during measurement of capacitance, inductance, resistance, and conductance. The obtained results are evaluated to define efficiency of proposed methods, their utility and performance. These results encourage more researches in this open problem of immitance measurement. ©2008 IEEE.},
bibtype = {inproceedings},
author = {Starostenko, Oleg and Rodriguez-Asomoza, Jorge and Alarcon-Aquino, Vicente},
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